Electrical resistivity studies of quasicrystalline Ti56Ni28-xFexSi16 (0< or= x< or= 15)


Journal article


D Bahadur, A Das, K Singh, AK Majumdar
Journal of Physics: Condensed Matter, vol. 3, IOP Publishing, 1991, p. 4125

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Cite

APA   Click to copy
Bahadur, D., Das, A., Singh, K., & Majumdar, A. K. (1991). Electrical resistivity studies of quasicrystalline Ti56Ni28-xFexSi16 (0< or= x< or= 15). Journal of Physics: Condensed Matter, 3, 4125.


Chicago/Turabian   Click to copy
Bahadur, D, A Das, K Singh, and AK Majumdar. “Electrical Resistivity Studies of Quasicrystalline Ti56Ni28-xFexSi16 (0≪ or= x≪ or= 15).” Journal of Physics: Condensed Matter 3 (1991): 4125.


MLA   Click to copy
Bahadur, D., et al. “Electrical Resistivity Studies of Quasicrystalline Ti56Ni28-xFexSi16 (0≪ or= x≪ or= 15).” Journal of Physics: Condensed Matter, vol. 3, IOP Publishing, 1991, p. 4125.


BibTeX   Click to copy

@article{bahadur1991a,
  title = {Electrical resistivity studies of quasicrystalline Ti56Ni28-xFexSi16 (0< or= x< or= 15)},
  year = {1991},
  journal = {Journal of Physics: Condensed Matter},
  pages = {4125},
  publisher = {IOP Publishing},
  volume = {3},
  author = {Bahadur, D and Das, A and Singh, K and Majumdar, AK}
}


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